Webinar: Considerations for in-situ mechanical, electrical and optical measurements of ICT materials in electron microscopes
On Friday 9 April 2021, a webinar will be organised by Lunjie Zeng, researcher at Chalmers University of Technology in Sweden, between 10:00 AM and 11:00 AM (GMT+2).
Free registration and link here.
Material development is of fundamental importance for the further advancement of Information and Communication Technologies (ICT). Especially, materials with desirable mechanical, electrical and optical properties are critical for the functionalities and availabilities of future generations of ICT. In situ electron microscopy is an indispensable tool for directly correlating these properties with structural information at high spatial resolution, enabling a fundamental understanding of materials performance. However, reliable in situ electron microscopy studies on ICT materials are still not straightforward and facing some challenges. For example, miniaturized dimensions of ICT materials used for in situ electron microscopy make reliable and reproducible sample transfer and preparation challenging. Another important issue is the realization and treatment of electrical contacts, often at the nanometer scale.
In this webinar, using semiconductor nanowires as examples, we will discuss some of the considerations for in situ mechanical, electrical and optical measurements of ICT materials in electron microscopes. We will explain and compare different approaches of transferring nanoscale samples into in situ electron microscopy sample holders. We will discuss means by which reliable electrical contacts can be established for in situ electron microscopy studies. We will also talk about how to treat and model electrical contacts in data analysis for reliably interpretating measurement results. Results from in situ electron microscopy measurement on individual III-V nanowires will be presented.
In situ electron microscopy will continue to play an important role in the research and development of ICT materials. The considerations presented here will help to develop reliable and streamlined measurement setups and protocols for the in-situ electron microscopy study on ICT materials, including semiconductor nanostructures.
No need to register in advance, just meet us on Friday 9 April 2021 at 10:00 AM (GMT+2) here.